<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/ats/QianWYZJLZMLCWYYZW09" mdate="2010-01-06">
<author>Jun Qian</author>
<author>Xingang Wang</author>
<author>Qinfu Yang</author>
<author>Fei Zhuang</author>
<author>Junbo Jia</author>
<author>Xiangfeng Li</author>
<author>Yuan Zuo</author>
<author>Jayanth Mekkoth</author>
<author>Jinsong Liu</author>
<author>Hao-Jan Chao</author>
<author>Shianling Wu</author>
<author>Huafeng Yang</author>
<author>Lizhen Yu</author>
<author>FeiFei Zhao</author>
<author>Laung-Terng Wang</author>
<title>Logic BIST Architecture for System-Level Test and Diagnosis.</title>
<pages>21-26</pages>
<year>2009</year>
<booktitle>Asian Test Symposium</booktitle>
<ee>http://doi.ieeecomputersociety.org/10.1109/ATS.2009.34</ee>
<crossref>conf/ats/2009</crossref>
<url>db/conf/ats/ats2009.html#QianWYZJLZMLCWYYZW09</url>
</inproceedings>
</dblp>
