Marc Perbost Ludovic Le Lan Christian Landrault Automatic Testability Analysis of Boards and MCMs at Chip Level. 36-41 1997 conf/ats/1997 Asian Test Symposium http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090036abs.htm db/conf/ats/ats1997.html#PerbostLL97