A New, Flexible and Very Accurate Crosstalk Fault Model to Analyze the Effects of Coupling Noise between the Interconnects on Signal Integrity Losses in Deep Submicron Chips.

Ajoy Kumar Palit Lei Wu Kishore K. Duganapalli Walter Anheier Jürgen Schlöffel A New, Flexible and Very Accurate Crosstalk Fault Model to Analyze the Effects of Coupling Noise between the Interconnects on Signal Integrity Losses in Deep Submicron Chips. 22-27 2005 conf/ats/2005 Asian Test Symposium http://doi.ieeecomputersociety.org/10.1109/ATS.2005.13 db/conf/ats/ats2005.html#PalitWDAS05