BibTeX
@inproceedings{DBLP:conf/ats/PalitWDAS05,
author = {Ajoy Kumar Palit and
Lei Wu and
Kishore K. Duganapalli and
Walter Anheier and
J{\"u}rgen Schl{\"o}ffel},
title = {A New, Flexible and Very Accurate Crosstalk Fault Model
to Analyze the Effects of Coupling Noise between the Interconnects
on Signal Integrity Losses in Deep Submicron Chips},
booktitle = {Asian Test Symposium},
year = {2005},
pages = {22-27},
ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.13},
crossref = {DBLP:conf/ats/2005},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/ats/2005,
title = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005,
Calcutta, India},
booktitle = {Asian Test Symposium},
publisher = {IEEE Computer Society},
year = {2005},
isbn = {0-7695-2481-8},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-03-14 by Michael Ley (ley@uni-trier.de)