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BibTeX record conf/ats/OhmatsuOIYLH22
@inproceedings{DBLP:conf/ats/OhmatsuOIYLH22, author = {Masao Ohmatsu and Yuto Ohtera and Yuki Ikiri and Hiroyuki Yotsuyanagi and Shyue{-}Kung Lu and Masaki Hashizume}, title = {Enhanced Interconnect Test Method for Resistive Open Defects in Final Tests with Relaxation Oscillators}, booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan, November 21-24, 2022}, pages = {49--53}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/ATS56056.2022.00021}, doi = {10.1109/ATS56056.2022.00021}, timestamp = {Wed, 11 Jan 2023 15:00:17 +0100}, biburl = {https://dblp.org/rec/conf/ats/OhmatsuOIYLH22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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