BibTeX record conf/ats/OhmatsuOIYLH22

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@inproceedings{DBLP:conf/ats/OhmatsuOIYLH22,
  author       = {Masao Ohmatsu and
                  Yuto Ohtera and
                  Yuki Ikiri and
                  Hiroyuki Yotsuyanagi and
                  Shyue{-}Kung Lu and
                  Masaki Hashizume},
  title        = {Enhanced Interconnect Test Method for Resistive Open Defects in Final
                  Tests with Relaxation Oscillators},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {49--53},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00021},
  doi          = {10.1109/ATS56056.2022.00021},
  timestamp    = {Wed, 11 Jan 2023 15:00:17 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/OhmatsuOIYLH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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