DBLP Record 'conf/ats/NoseS98'

BibTeX

@inproceedings{DBLP:conf/ats/NoseS98,
  author    = {Koichi Nose and
               Takayasu Sakurai},
  title     = {Integrated Current Sensing Device for Micro IDDQ Test},
  booktitle = {Asian Test Symposium},
  year      = {1998},
  pages     = {323-326},
  ee        = {http://csdl.computer.org/comp/proceedings/ats/1998/8277/00/82770323abs.htm},
  crossref  = {DBLP:conf/ats/1998},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ats/1998,
  title     = {7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {1998},
  isbn      = {0-8186-8277-9},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}