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BibTeX record conf/ats/NieJYWWN23
@inproceedings{DBLP:conf/ats/NieJYWWN23, author = {Mu Nie and Wen Jiang and Wankou Yang and Senling Wang and Xiaoqing Wen and Tianming Ni}, title = {Enhancing Defect Diagnosis and Localization in Wafer Map Testing Through Weakly Supervised Learning}, booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October 14-17, 2023}, pages = {1--6}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/ATS59501.2023.10317989}, doi = {10.1109/ATS59501.2023.10317989}, timestamp = {Fri, 08 Dec 2023 20:28:22 +0100}, biburl = {https://dblp.org/rec/conf/ats/NieJYWWN23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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