Michinobu Nakao Yoshikazu Kiyoshige Kazumi Hatayama Yasuo Sato Takaharu Nagumo Test Generation for Multiple-Threshold Gate-Delay Fault Model. 244- 2001 conf/ats/2001 Asian Test Symposium http://csdl.computer.org/comp/proceedings/ats/2001/1378/00/13780244abs.htm db/conf/ats/ats2001.html#NakaoKHSN01