@inproceedings{DBLP:conf/ats/MiyaseTKWR05,
  author    = {Kohei Miyase and
               Kenta Terashima and
               Seiji Kajihara and
               Xiaoqing Wen and
               Sudhakar M. Reddy},
  title     = {On Improving Defect Coverage of Stuck-at Fault Tests},
  booktitle = {Asian Test Symposium},
  year      = {2005},
  pages     = {216-223},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.84},
  crossref  = {DBLP:conf/ats/2005},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ats/2005,
  title     = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005,
               Calcutta, India},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {2005},
  isbn      = {0-7695-2481-8},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}