BibTeX record conf/ats/MiuraNNF97

download as .bib file

@inproceedings{DBLP:conf/ats/MiuraNNF97,
  author       = {Katsuyoshi Miura and
                  Kohei Nakata and
                  Koji Nakamae and
                  Hiromu Fujioka},
  title        = {Automatic {EB} Fault Tracing System by Successive Circuit Extraction
                  from {VLSI} {CAD} Layout Data},
  booktitle    = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
                  Japan},
  pages        = {162--167},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/ATS.1997.643953},
  doi          = {10.1109/ATS.1997.643953},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/MiuraNNF97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.