BibTeX record: conf/ats/MishraSSSCS10

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@inproceedings{DBLP:conf/ats/MishraSSSCS10,
  author    = {Amit Mishra and
               Nidhi Sinha and
               Satdev and
               Virendra Singh and
               Sreejit Chakravarty and
               Adit D. Singh},
  title     = {Modified Scan Flip-Flop for Low Power Testing},
  booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
               December 2010, Shanghai, China},
  year      = {2010},
  pages     = {367--370},
  crossref  = {DBLP:conf/ats/2010},
  url       = {http://dx.doi.org/10.1109/ATS.2010.69},
  doi       = {10.1109/ATS.2010.69},
  timestamp = {Sat, 25 Oct 2014 17:39:03 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/ats/MishraSSSCS10},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/ats/2010,
  title     = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
               December 2010, Shanghai, China},
  year      = {2010},
  publisher = {{IEEE} Computer Society},
  isbn      = {978-0-7695-4248-5},
  timestamp = {Sat, 25 Oct 2014 17:39:03 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/ats/2010},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}