BibTeX record conf/ats/MahlstedtAH95

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@inproceedings{DBLP:conf/ats/MahlstedtAH95,
  author       = {Udo Mahlstedt and
                  J{\"{u}}rgen Alt and
                  Ingo Hollenbeck},
  title        = {Deterministic test generation for non-classical faults on the gate
                  level},
  booktitle    = {4th Asian Test Symposium {(ATS} '95), November 23-24, 1995. Bangalore,
                  India},
  pages        = {244--251},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/ATS.1995.485343},
  doi          = {10.1109/ATS.1995.485343},
  timestamp    = {Fri, 24 Mar 2023 00:02:33 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/MahlstedtAH95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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