BibTeX record conf/ats/LuZH16

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@inproceedings{DBLP:conf/ats/LuZH16,
  author       = {Shyue{-}Kung Lu and
                  Shang{-}Xiu Zhong and
                  Masaki Hashizume},
  title        = {Adaptive {ECC} Techniques for Yield and Reliability Enhancement of
                  Flash Memories},
  booktitle    = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
                  21-24, 2016},
  pages        = {287--292},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://doi.org/10.1109/ATS.2016.64},
  doi          = {10.1109/ATS.2016.64},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/LuZH16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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