BibTeX record conf/ats/LiuWLBN20

download as .bib file

@inproceedings{DBLP:conf/ats/LiuWLBN20,
  author       = {Chih{-}Yan Liu and
                  Mu{-}Ting Wu and
                  James Chien{-}Mo Li and
                  Gaurav Bhargava and
                  Chris Nigh},
  title        = {Systematic Hold-time Fault Diagnosis and Failure Debug in Production
                  Chips},
  booktitle    = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
                  23-26, 2020},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ATS49688.2020.9301504},
  doi          = {10.1109/ATS49688.2020.9301504},
  timestamp    = {Mon, 03 Jan 2022 22:41:43 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/LiuWLBN20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.