BibTeX record conf/ats/LinWL16

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@inproceedings{DBLP:conf/ats/LinWL16,
  author       = {Sheng{-}Lin Lin and
                  Cheng{-}Hung Wu and
                  Kuen{-}Jong Lee},
  title        = {Repairable Cell-Based Chip Design for Simultaneous Yield Enhancement
                  and Fault Diagnosis},
  booktitle    = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
                  21-24, 2016},
  pages        = {25--30},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://doi.org/10.1109/ATS.2016.27},
  doi          = {10.1109/ATS.2016.27},
  timestamp    = {Fri, 24 Mar 2023 00:02:33 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/LinWL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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