LinH03'

BibTeX

@inproceedings{DBLP:conf/ats/LinH03,
  author    = {Yu-Chiun Lin and
               Shi-Yu Huang},
  title     = {Chip-Level Diagnostic Strategy for Full-Scan Designs with
               Multiple Faults},
  booktitle = {Asian Test Symposium},
  year      = {2003},
  pages     = {38-43},
  ee        = {http://csdl.computer.org/comp/proceedings/ats/2003/1951/00/19510038abs.htm},
  crossref  = {DBLP:conf/ats/2003},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ats/2003,
  title     = {12th Asian Test Symposium (ATS 2003), 17-19 November 2003,
               Xian, China},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {2003},
  isbn      = {0-7695-1951-2},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}