BibTeX record conf/ats/LiLLWTL23

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@inproceedings{DBLP:conf/ats/LiLLWTL23,
  author       = {Wenxing Li and
                  Hongqin Lyu and
                  Shengwen Liang and
                  Tiancheng Wang and
                  Pengyu Tian and
                  Huawei Li},
  title        = {Intelligent Automatic Test Pattern Generation for Digital Circuits
                  Based on Reinforcement Learning},
  booktitle    = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
                  14-17, 2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ATS59501.2023.10317953},
  doi          = {10.1109/ATS59501.2023.10317953},
  timestamp    = {Fri, 08 Dec 2023 20:28:22 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/LiLLWTL23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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