BibTeX record conf/ats/LeiMCSC18

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@inproceedings{DBLP:conf/ats/LeiMCSC18,
  author       = {Jun{-}Yang Lei and
                  Thomas Moon and
                  Justin Chow and
                  Suresh K. Sitaraman and
                  Abhijit Chatterjee},
  title        = {A Monobit Built-In Test and Diagnostic System for Flexible Electronic
                  Interconnect},
  booktitle    = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
                  15-18, 2018},
  pages        = {191--196},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ATS.2018.00044},
  doi          = {10.1109/ATS.2018.00044},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/LeiMCSC18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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