![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
BibTeX record conf/ats/LaiP96
@inproceedings{DBLP:conf/ats/LaiP96, author = {Kowen Lai and Christos A. Papachristou}, title = {{BIST} Testability Enhancement of System Level Circuits : Experience with An Industrial Design}, booktitle = {5th Asian Test Symposium {(ATS} '96), November 20-22, 1996, Hsinchu, Taiwan}, pages = {219}, publisher = {{IEEE} Computer Society}, year = {1996}, url = {https://doi.org/10.1109/ATS.1996.555162}, doi = {10.1109/ATS.1996.555162}, timestamp = {Fri, 24 Mar 2023 00:02:33 +0100}, biburl = {https://dblp.org/rec/conf/ats/LaiP96.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.