BibTeX record conf/ats/KumarDKKCM19

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@inproceedings{DBLP:conf/ats/KumarDKKCM19,
  author       = {Vinay B. Y. Kumar and
                  Suman Deb and
                  Rupesh Kumar and
                  Mustafa Khairallah and
                  Anupam Chattopadhyay and
                  Avi Mendelson},
  title        = {Recruiting Fault Tolerance Techniques for Microprocessor Security},
  booktitle    = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
                  10-13, 2019},
  pages        = {80--85},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ATS47505.2019.00015},
  doi          = {10.1109/ATS47505.2019.00015},
  timestamp    = {Tue, 07 May 2024 20:12:45 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/KumarDKKCM19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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