@inproceedings{DBLP:conf/ats/KoWL02,
author = {K. Y. Ko and
Mike W. T. Wong and
Y. S. Lee},
title = {Testing System-On-Chip by Summations of Cores? Test Output
Voltages},
booktitle = {Asian Test Symposium},
year = {2002},
pages = {350-355},
ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2002.1181736},
crossref = {DBLP:conf/ats/2002},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/ats/2002,
title = {11th Asian Test Symposium (ATS 2002), 18-20 November 2002,
Guam, USA},
booktitle = {Asian Test Symposium},
publisher = {IEEE Computer Society},
year = {2002},
isbn = {0-7695-1825-7},
bibsource = {DBLP, http://dblp.uni-trier.de}
}