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BibTeX record conf/ats/KimYLK05
@inproceedings{DBLP:conf/ats/KimYLK05, author = {Youbean Kim and Myung{-}Hoon Yang and Yong Lee and Sungho Kang}, title = {A New Low Power Test Pattern Generator using a Transition Monitoring Window based on {BIST} Architecture}, booktitle = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta, India}, pages = {230--235}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/ATS.2005.12}, doi = {10.1109/ATS.2005.12}, timestamp = {Wed, 28 Feb 2024 10:43:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/KimYLK05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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