BibTeX record conf/ats/KimYLK05

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@inproceedings{DBLP:conf/ats/KimYLK05,
  author       = {Youbean Kim and
                  Myung{-}Hoon Yang and
                  Yong Lee and
                  Sungho Kang},
  title        = {A New Low Power Test Pattern Generator using a Transition Monitoring
                  Window based on {BIST} Architecture},
  booktitle    = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta,
                  India},
  pages        = {230--235},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ATS.2005.12},
  doi          = {10.1109/ATS.2005.12},
  timestamp    = {Wed, 28 Feb 2024 10:43:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KimYLK05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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