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BibTeX record conf/ats/KimCKYK08
@inproceedings{DBLP:conf/ats/KimCKYK08, author = {Taejin Kim and Sunghoon Chun and YongJoon Kim and Myung{-}Hoon Yang and Sungho Kang}, title = {An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme}, booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November 24-27, 2008}, pages = {151--156}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/ATS.2008.58}, doi = {10.1109/ATS.2008.58}, timestamp = {Tue, 27 Feb 2024 16:41:39 +0100}, biburl = {https://dblp.org/rec/conf/ats/KimCKYK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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