BibTeX record conf/ats/KimCKYK08

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@inproceedings{DBLP:conf/ats/KimCKYK08,
  author       = {Taejin Kim and
                  Sunghoon Chun and
                  YongJoon Kim and
                  Myung{-}Hoon Yang and
                  Sungho Kang},
  title        = {An Effective Hybrid Test Data Compression Method Using Scan Chain
                  Compaction and Dictionary-Based Scheme},
  booktitle    = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
                  24-27, 2008},
  pages        = {151--156},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/ATS.2008.58},
  doi          = {10.1109/ATS.2008.58},
  timestamp    = {Tue, 27 Feb 2024 16:41:39 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KimCKYK08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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