Kazuo Kawakubo Koji Tanaka Hiromi Hiraishi Formal Verification Of Self-Testing Properties Of Combinational Circuits. 119-122 1996 conf/ats/1996 Asian Test Symposium http://csdl.computer.org/comp/proceedings/ats/1996/7478/00/74780119abs.htm db/conf/ats/ats1996.html#KawakuboTH96