BibTeX record: conf/ats/KawakuboTH96

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@inproceedings{DBLP:conf/ats/KawakuboTH96,
  author    = {Kazuo Kawakubo and
               Koji Tanaka and
               Hiromi Hiraishi},
  title     = {Formal Verification Of Self-Testing Properties Of Combinational Circuits},
  booktitle = {5th Asian Test Symposium {(ATS} '96), November 20-22, 1996, Hsinchu,
               Taiwan},
  year      = {1996},
  pages     = {119--122},
  crossref  = {DBLP:conf/ats/1996},
  url       = {http://doi.ieeecomputersociety.org/10.1109/ATS.1996.555147},
  doi       = {10.1109/ATS.1996.555147},
  timestamp = {Wed, 22 Oct 2014 15:01:10 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/ats/KawakuboTH96},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/ats/1996,
  title     = {5th Asian Test Symposium {(ATS} '96), November 20-22, 1996, Hsinchu,
               Taiwan},
  year      = {1996},
  publisher = {{IEEE} Computer Society},
  timestamp = {Wed, 22 Oct 2014 15:01:10 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/ats/1996},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}