@inproceedings{DBLP:conf/ats/KawakuboTH96,
author = {Kazuo Kawakubo and
Koji Tanaka and
Hiromi Hiraishi},
title = {Formal Verification Of Self-Testing Properties Of Combinational
Circuits},
booktitle = {Asian Test Symposium},
year = {1996},
pages = {119-122},
ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.1996.555147},
crossref = {DBLP:conf/ats/1996},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/ats/1996,
title = {5th Asian Test Symposium (ATS '96), November 20-22, 1996,
Hsinchu, Taiwan},
booktitle = {Asian Test Symposium},
publisher = {IEEE Computer Society},
year = {1996},
bibsource = {DBLP, http://dblp.uni-trier.de}
}