BibTeX record conf/ats/KambaraYMHL17

download as .bib file

@inproceedings{DBLP:conf/ats/KambaraYMHL17,
  author       = {Ayumu Kambara and
                  Hiroyuki Yotsuyanagi and
                  Daichi Miyoshi and
                  Masaki Hashizume and
                  Shyue{-}Kung Lu},
  title        = {Open Defect Detection with a Built-in Test Circuit by {IDDT} Appearance
                  Time in {CMOS} ICs},
  booktitle    = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
                  November 27-30, 2017},
  pages        = {242--247},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/ATS.2017.53},
  doi          = {10.1109/ATS.2017.53},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KambaraYMHL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.