KajiharaMK99'

@inproceedings{DBLP:conf/ats/KajiharaMK99,
  author    = {Seiji Kajihara and
               Atsushi Murakami and
               Tomohisa Kaneko},
  title     = {On Compact Test Sets for Multiple Stuck-at Faults for Large
               Circuits},
  booktitle = {Asian Test Symposium},
  year      = {1999},
  pages     = {20-24},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810724},
  crossref  = {DBLP:conf/ats/1999},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ats/1999,
  title     = {8th Asian Test Symposium (ATS '99), 16-18 November 1999,
               Shanghai, China},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {1999},
  isbn      = {0-7695-0315-2},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}