BibTeX record conf/ats/JanickiMSU20

download as .bib file

@inproceedings{DBLP:conf/ats/JanickiMSU20,
  author       = {Jakub Janicki and
                  Grzegorz Mrugalski and
                  Artur Stelmach and
                  Szczepan Urban},
  title        = {Scan Chain Diagnosis-Driven Test Response Compactor},
  booktitle    = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
                  23-26, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ATS49688.2020.9301584},
  doi          = {10.1109/ATS49688.2020.9301584},
  timestamp    = {Fri, 15 Jan 2021 14:54:21 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/JanickiMSU20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.