Achieving High Test Quality with Reduced Pin Count Testing.

Jay Jahangiri Nilanjan Mukherjee Wu-Tung Cheng Subramanian Mahadevan Ron Press Achieving High Test Quality with Reduced Pin Count Testing. 312-317 2005 conf/ats/2005 Asian Test Symposium http://doi.ieeecomputersociety.org/10.1109/ATS.2005.19 db/conf/ats/ats2005.html#JahangiriMCMP05