BibTeX record conf/ats/IwataMM21

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@inproceedings{DBLP:conf/ats/IwataMM21,
  author       = {Hiroyuki Iwata and
                  Yoichi Maeda and
                  Jun Matsushima},
  title        = {A Power Reduction Method for Scan Testing in Ultra-Low Power Designs},
  booktitle    = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
                  November 22-25, 2021},
  pages        = {141},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ATS52891.2021.00037},
  doi          = {10.1109/ATS52891.2021.00037},
  timestamp    = {Mon, 17 Jan 2022 16:24:22 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/IwataMM21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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