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BibTeX record conf/ats/IwataMM21
@inproceedings{DBLP:conf/ats/IwataMM21, author = {Hiroyuki Iwata and Yoichi Maeda and Jun Matsushima}, title = {A Power Reduction Method for Scan Testing in Ultra-Low Power Designs}, booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan, November 22-25, 2021}, pages = {141}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/ATS52891.2021.00037}, doi = {10.1109/ATS52891.2021.00037}, timestamp = {Mon, 17 Jan 2022 16:24:22 +0100}, biburl = {https://dblp.org/rec/conf/ats/IwataMM21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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