BibTeX record conf/ats/InoueGF00

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@inproceedings{DBLP:conf/ats/InoueGF00,
  author       = {Michiko Inoue and
                  Emil Gizdarski and
                  Hideo Fujiwara},
  title        = {A class of sequential circuits with combinational test generation
                  complexity under single-fault assumption},
  booktitle    = {9th Asian Test Symposium {(ATS} 2000), 4-6 December 2000, Taipei,
                  Taiwan},
  pages        = {398--403},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/ATS.2000.893656},
  doi          = {10.1109/ATS.2000.893656},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/InoueGF00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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