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BibTeX record conf/ats/IchiharaIOHF05
@inproceedings{DBLP:conf/ats/IchiharaIOHF05, author = {Hideyuki Ichihara and Tomoo Inoue and Naoki Okamoto and Toshinori Hosokawa and Hideo Fujiwara}, title = {An Effective Design for Hierarchical Test Generation Based on Strong Testability}, booktitle = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta, India}, pages = {288--293}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/ATS.2005.23}, doi = {10.1109/ATS.2005.23}, timestamp = {Fri, 24 Mar 2023 00:02:34 +0100}, biburl = {https://dblp.org/rec/conf/ats/IchiharaIOHF05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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