Jason P. Hurst Nick Kanopoulos Flip-flop sharing in standard scan path to enhance delay fault testing of sequential circuits. 346-352 1995 conf/ats/1995 Asian Test Symposium http://csdl.computer.org/comp/proceedings/ats/1995/7129/00/71290346abs.htm db/conf/ats/ats1995.html#HurstK95