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BibTeX record conf/ats/HurstK95
@inproceedings{DBLP:conf/ats/HurstK95, author = {Jason P. Hurst and Nick Kanopoulos}, title = {Flip-flop sharing in standard scan path to enhance delay fault testing of sequential circuits}, booktitle = {4th Asian Test Symposium {(ATS} '95), November 23-24, 1995. Bangalore, India}, pages = {346--352}, publisher = {{IEEE} Computer Society}, year = {1995}, url = {https://doi.org/10.1109/ATS.1995.485359}, doi = {10.1109/ATS.1995.485359}, timestamp = {Fri, 24 Mar 2023 00:02:34 +0100}, biburl = {https://dblp.org/rec/conf/ats/HurstK95.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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