HuY03'

@inproceedings{DBLP:conf/ats/HuY03,
  author    = {He Hu and
               Yihe Sun},
  title     = {Test-Point Selection Algorithm Using Small Signal Model
               for Scan-Based BIST},
  booktitle = {Asian Test Symposium},
  year      = {2003},
  pages     = {507},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250877},
  crossref  = {DBLP:conf/ats/2003},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ats/2003,
  title     = {12th Asian Test Symposium (ATS 2003), 17-19 November 2003,
               Xian, China},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {2003},
  isbn      = {0-7695-1951-2},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}