BibTeX record: conf/ats/HuY03

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@inproceedings{DBLP:conf/ats/HuY03,
  author    = {He Hu and
               Yihe Sun},
  title     = {Test-Point Selection Algorithm Using Small Signal Model for Scan-Based
               {BIST}},
  booktitle = {12th Asian Test Symposium {(ATS} 2003), 17-19 November 2003, Xian,
               China},
  year      = {2003},
  pages     = {507},
  crossref  = {DBLP:conf/ats/2003},
  url       = {http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250877},
  doi       = {10.1109/ATS.2003.1250877},
  timestamp = {Wed, 01 Oct 2014 06:30:28 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/ats/HuY03},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/ats/2003,
  title     = {12th Asian Test Symposium {(ATS} 2003), 17-19 November 2003, Xian,
               China},
  year      = {2003},
  publisher = {{IEEE} Computer Society},
  isbn      = {0-7695-1951-2},
  timestamp = {Wed, 01 Oct 2014 06:30:28 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/ats/2003},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}