Junichi Hirase Yoshiyuki Goi Yoshiyuki Tanaka IDDQ Testing Method using a Scan Pattern for Production Testing. 18-21 2005 conf/ats/2005 Asian Test Symposium http://doi.ieeecomputersociety.org/10.1109/ATS.2005.66 db/conf/ats/ats2005.html#HiraseGT05