BibTeX record conf/ats/HigamiSTKT08

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@inproceedings{DBLP:conf/ats/HigamiSTKT08,
  author       = {Yoshinobu Higami and
                  Kewal K. Saluja and
                  Hiroshi Takahashi and
                  Shin{-}ya Kobayashi and
                  Yuzo Takamatsu},
  title        = {Increasing Defect Coverage by Generating Test Vectors for Stuck-Open
                  Faults},
  booktitle    = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
                  24-27, 2008},
  pages        = {97--102},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/ATS.2008.39},
  doi          = {10.1109/ATS.2008.39},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HigamiSTKT08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}