BibTeX record conf/ats/HigamiKT02

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@inproceedings{DBLP:conf/ats/HigamiKT02,
  author       = {Yoshinobu Higami and
                  Shin{-}ya Kobayashi and
                  Yuzo Takamatsu},
  title        = {A Method to Reduce Power Dissipation during Test for Sequential Circuits},
  booktitle    = {11th Asian Test Symposium {(ATS} 2002), 18-20 November 2002, Guam,
                  {USA}},
  pages        = {326--331},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/ATS.2002.1181732},
  doi          = {10.1109/ATS.2002.1181732},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HigamiKT02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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