DBLP Record 'conf/ats/HigamiKKT04'

BibTeX

@inproceedings{DBLP:conf/ats/HigamiKKT04,
  author    = {Yoshinobu Higami and
               Seiji Kajihara and
               Shin-ya Kobayashi and
               Yuzo Takamatsu},
  title     = {Techniques for Finding Xs in Test Sequences for Sequential
               Circuits and Applications to Test Length/Power Reduction},
  booktitle = {Asian Test Symposium},
  year      = {2004},
  pages     = {46-49},
  ee        = {http://csdl.computer.org/comp/proceedings/ats/2004/2235/00/22350046abs.htm},
  crossref  = {DBLP:conf/ats/2004},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ats/2004,
  title     = {13th Asian Test Symposium (ATS 2004), 15-17 November 2004,
               Kenting, Taiwan},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {2004},
  isbn      = {0-7695-2235-1},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}