BibTeX record conf/ats/HashizumeYYTKMT04

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@inproceedings{DBLP:conf/ats/HashizumeYYTKMT04,
  author       = {Masaki Hashizume and
                  Daisuke Yoneda and
                  Hiroyuki Yotsuyanagi and
                  Tetsuo Tada and
                  Takeshi Koyama and
                  Ikuro Morita and
                  Takeomi Tamesada},
  title        = {I{\_}DDQ Test Method Based on Wavelet Transformation for Noisy Current
                  Measurement Environment},
  booktitle    = {13th Asian Test Symposium {(ATS} 2004), 15-17 November 2004, Kenting,
                  Taiwan},
  pages        = {112--117},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/ATS.2004.50},
  doi          = {10.1109/ATS.2004.50},
  timestamp    = {Fri, 24 Mar 2023 00:02:33 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HashizumeYYTKMT04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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