BibTeX record conf/ats/HashizumeTYTMK03

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@inproceedings{DBLP:conf/ats/HashizumeTYTMK03,
  author    = {Masaki Hashizume and
               Teppei Takeda and
               Hiroyuki Yotsuyanagi and
               Takeomi Tamesada and
               Yukiya Miura and
               Kozo Kinoshita},
  title     = {A {BIST} Circuit for {IDDQ} Tests},
  booktitle = {12th Asian Test Symposium {(ATS} 2003), 17-19 November 2003, Xian,
               China},
  pages     = {390--395},
  year      = {2003},
  crossref  = {DBLP:conf/ats/2003},
  url       = {http://dx.doi.org/10.1109/ATS.2003.1250843},
  doi       = {10.1109/ATS.2003.1250843},
  timestamp = {Thu, 14 Jan 2016 10:13:57 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/ats/HashizumeTYTMK03},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/ats/2003,
  title     = {12th Asian Test Symposium {(ATS} 2003), 17-19 November 2003, Xian,
               China},
  publisher = {{IEEE} Computer Society},
  year      = {2003},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8853},
  isbn      = {0-7695-1951-2},
  timestamp = {Thu, 14 Jan 2016 10:13:57 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/ats/2003},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}