BibTeX record conf/ats/HashizumeKT97

download as .bib file

@inproceedings{DBLP:conf/ats/HashizumeKT97,
  author       = {Masaki Hashizume and
                  Toshimasa Kuchii and
                  Takeomi Tamesada},
  title        = {Supply Current Test for Unit-to-unit Variations of Electrical Characteristics
                  in Gates},
  booktitle    = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
                  Japan},
  pages        = {372--377},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/ATS.1997.643985},
  doi          = {10.1109/ATS.1997.643985},
  timestamp    = {Fri, 24 Mar 2023 00:02:33 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HashizumeKT97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.