HashizumeKT97'

@inproceedings{DBLP:conf/ats/HashizumeKT97,
  author    = {Masaki Hashizume and
               Toshimasa Kuchii and
               Takeomi Tamesada},
  title     = {Supply Current Test for Unit-to-unit Variations of Electrical
               Characteristics in Gates},
  booktitle = {Asian Test Symposium},
  year      = {1997},
  pages     = {372-377},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643985},
  crossref  = {DBLP:conf/ats/1997},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ats/1997,
  title     = {6th Asian Test Symposium (ATS '97), 17-18 November 1997,
               Akita, Japan},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {1997},
  isbn      = {0-8186-8209-4},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}