BibTeX record conf/ats/HamdiouiPLWRY17

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@inproceedings{DBLP:conf/ats/HamdiouiPLWRY17,
  author       = {Said Hamdioui and
                  Peyman Pouyan and
                  Huawei Li and
                  Ying Wang and
                  Arijit Raychowdhury and
                  Insik Yoon},
  title        = {Test and Reliability of Emerging Non-volatile Memories},
  booktitle    = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
                  November 27-30, 2017},
  pages        = {175--183},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/ATS.2017.42},
  doi          = {10.1109/ATS.2017.42},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HamdiouiPLWRY17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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