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BibTeX record conf/ats/GirardLMPV98
@inproceedings{DBLP:conf/ats/GirardLMPV98, author = {Patrick Girard and Christian Landrault and V. Moreda and Serge Pravossoudovitch and Arnaud Virazel}, title = {A {BIST} Structure to Test Delay Faults in a Scan Environment}, booktitle = {7th Asian Test Symposium {(ATS} '98), 2-4 December 1998, Singapore}, pages = {435--439}, publisher = {{IEEE} Computer Society}, year = {1998}, url = {https://doi.org/10.1109/ATS.1998.741653}, doi = {10.1109/ATS.1998.741653}, timestamp = {Fri, 24 Mar 2023 00:02:33 +0100}, biburl = {https://dblp.org/rec/conf/ats/GirardLMPV98.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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