BibTeX record conf/ats/DililloGPVB03

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@inproceedings{DBLP:conf/ats/DililloGPVB03,
  author       = {Luigi Dilillo and
                  Patrick Girard and
                  Serge Pravossoudovitch and
                  Arnaud Virazel and
                  Simone Borri},
  title        = {Comparison of Open and Resistive-Open Defect Test Conditions in {SRAM}
                  Address Decoders},
  booktitle    = {12th Asian Test Symposium {(ATS} 2003), 17-19 November 2003, Xian,
                  China},
  pages        = {250--255},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/ATS.2003.1250818},
  doi          = {10.1109/ATS.2003.1250818},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/DililloGPVB03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}