Jwu E. Chen Chung-Len Lee Wen-Zen Shen Beyin Chen Fanout fault analysis for digital logic circuits. 33-39 1995 conf/ats/1995 Asian Test Symposium http://csdl.computer.org/comp/proceedings/ats/1995/7129/00/71290033abs.htm db/conf/ats/ats1995.html#ChenLSC95