ChenLSC95'

BibTeX

@inproceedings{DBLP:conf/ats/ChenLSC95,
  author    = {Jwu E. Chen and
               Chung-Len Lee and
               Wen-Zen Shen and
               Beyin Chen},
  title     = {Fanout fault analysis for digital logic circuits},
  booktitle = {Asian Test Symposium},
  year      = {1995},
  pages     = {33-39},
  ee        = {http://csdl.computer.org/comp/proceedings/ats/1995/7129/00/71290033abs.htm},
  crossref  = {DBLP:conf/ats/1995},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ats/1995,
  title     = {4th Asian Test Symposium (ATS '95), November 23-24, 1995.
               Bangalore, India},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {1995},
  isbn      = {0-8186-7129-7},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}