BibTeX record conf/ats/ChenCCW16

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@inproceedings{DBLP:conf/ats/ChenCCW16,
  author       = {Harry H. Chen and
                  Simon Y.{-}H. Chen and
                  Po{-}Yao Chuang and
                  Cheng{-}Wen Wu},
  title        = {Efficient Cell-Aware Fault Modeling by Switch-Level Test Generation},
  booktitle    = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
                  21-24, 2016},
  pages        = {197--202},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://doi.org/10.1109/ATS.2016.33},
  doi          = {10.1109/ATS.2016.33},
  timestamp    = {Sat, 30 Sep 2023 09:34:54 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/ChenCCW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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