Effective parallel processing techniques for the generation of test data for a logic built-in self test system.

Paul Chang Brion L. Keller Sarala Paliwal Effective parallel processing techniques for the generation of test data for a logic built-in self test system. 374-379 2000 conf/ats/2000 Asian Test Symposium http://csdl.computer.org/comp/proceedings/ats/2000/0887/00/08870374abs.htm db/conf/ats/ats2000.html#ChangKP00