BibTeX record conf/ats/CarloSSP08

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@inproceedings{DBLP:conf/ats/CarloSSP08,
  author       = {Stefano Di Carlo and
                  Alessandro Savino and
                  Alberto Scionti and
                  Paolo Prinetto},
  title        = {Influence of Parasitic Capacitance Variations on 65 nm and 32 nm Predictive
                  Technology Model {SRAM} Core-Cells},
  booktitle    = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
                  24-27, 2008},
  pages        = {411--416},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/ATS.2008.13},
  doi          = {10.1109/ATS.2008.13},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/CarloSSP08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}